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dc.contributor.authorSuhatin, Dhana-
dc.contributor.authorSudarti, Sudarti-
dc.contributor.authorPrihandono, Trapsilo-
dc.date.accessioned2017-11-30T08:04:23Z-
dc.date.available2017-11-30T08:04:23Z-
dc.date.issued2017-11-30-
dc.identifier.issn2301-9794-
dc.identifier.urihttp://repository.unej.ac.id/handle/123456789/83524-
dc.descriptionJurnal Pembelajaran Fisika, Vol 6 No. 2, Juni 2017, hal 208-214en_US
dc.description.abstractResearch on the analysis of the magnetic field intensity ELF (Extremely Low Frequency) is essentially an attempt to prevent the impact of disease risks posed by electromagnetic field radiation. Measuring instrument used to measure the magnetic field intensity EMF 827 is capable of measuring magnetic fields up to 2000 μT. The results of the intensity of exposure to magnetic fields measured by variations in distance of 20, 40, 60, 80 and 100 cm. The distance is selected because the distance is the distance that allows direct interaction with the magnetic field source. Issues to be studied are comparative intensity of the magnetic field around the electronic equipment with natural magnetic field and the magnetic field distribution around the electronic equipment with a power ≥ 1000 W. Results of comparative data are analyzed using OneWay ANOVA aided by SPSS 23 and presented in the profile / contour Surfer application assisted version 11.en_US
dc.language.isoiden_US
dc.subjectAnalysis of the magnetic field intensity ELFen_US
dc.subjectEMF 827en_US
dc.subjectOne-Way Anovaen_US
dc.subjectprofile / contouren_US
dc.subjectSurfer application assisteden_US
dc.titleANALISIS INTENSITAS MEDAN MAGNET ELF (EXTREMELY LOW FREQUENCY) DI SEKITAR PERALATAN ELEKTRONIK DENGAN DAYA ≥ 1000 Wen_US
dc.typeArticleen_US
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